Kavitha Ramasamy
نویسندگان
چکیده
There is recently an interest in test generation for reversible circuits, but nothing has been published about fault localization in such circuits. The paper deals with fault localization for binary permutative reversible circuits. We concentrate on functional test based fault localization, and we generate an adaptive tree that depicts those faults that can be detected and localized. A striking property of reversible circuits is that they exhibit “symmetric” adaptive trees. This helps considerably by being able to generate only half of the tree, and the other half is created as the mirror image of the first half. Because each test covers half faults, it is relatively easy to generate the tree using a greedy algorithm. Thus the problem of fault localization of reversible circuits is easier than the same problem for standard irreversible circuits.
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تاریخ انتشار 2004